XPS PHI Versa Probe IV

A 0 - 5 kV argon ion gun with floating extraction that generates high current density at low beam energy for effective specimen cleaning, depth profiling and charge neutralization. A bend in the column minimizes neutrals. Differential pumping of the ion gun is included. • A microscope camera and a light source for sample positioning. • A Windows–based PC controlling all necessary hardware, analysis, data massage and data output. Includes a DVD drive and a color wide-screen LCD monitor. • SmartSoft-VersaProbeTM software (Microsoft Windows compatible) for full analytical capability including surveys, high-resolution multiplexes, sputter depth profiles, line scans, chemical images, automated analyses and user-defined settings. Full support for all automation. The system is compatible with remote operation. "• PHI MultipakTM software with an extensive library of post-analysis data processing algorithms including: atomic concentration quantification, background subtraction, smoothing, peak identification, linear least squares fitting, target factor analysis, curve and peak analysis and separation of multiple chemical states in maps, line scans and profiles." • UHV compatible analysis chamber featuring stainless steel construction and Turbo Molecular Pump with titanium sublimation pump. Automated and interlocked bake out control. An introduction chamber optimized for fast pump down via turbomolecular and rotary backing pump. Transfer of the sample holder into analysis chamber by a magnetically coupled rod and an interlocked pneumatic gate valve. • Heat exchanger for X-ray source cooling is included. • Instruction manuals and operator’s chair and table. • System assembly, performance verification, installation and a one year warranty excluding consumables. Include Accessories Ultra Violet Source Option (UPS) • Optional Ultra Violet source for Ultraviolet Photoelectron Spectroscopy, fully computer controlled with automated lamp ignition and gas delivery. • Includes complete two stage differential pumping with a dedicated turbo molecular pump and two rotary pumps • Helium gas is the standard gas and it can produce He I, He II excitation. • For an anticipated high usage rate of He UPS, it is recommended to change the main system pump from an ion pump to an optional turbo molecular pump. Low Energy Inverse Photoelectron Spectroscopy Option (LEIPS) "• Electronic state of unoccupied level (conduction band) can be measured without sample damage by LEIPS option. • Include a retractable photodetector and controllers, and an electron neutralizer (< 5 eV) in standard system is used as the electron excitation source. • Bremsstrahlung isochromat spectra (BIS) are acquired by scanning the sample bias. • Detectable energy range is upto 5.79 eV. • Two optical filters 214 nm (5.79 eV) and 260 nm (4.77 eV) bandpass filter are included. The filters are outside the vacuum and can be easily switched. • A 24° pre-tilted holder, necessary for LEIPS measurement, is included." Scanning Auger Microscopy (SAM) "• < 100 nm electron beam diameter (< 150nm with GCIB/TMP option) with a 10kV electron beam • This option employs the electron gun with a LaB6 emitter and provides the functions of secondary electron imaging, Auger spectroscopy up to 2400 eV, line scans, maps, depth profiles and REELS spectroscopy. • Digitally controlled and fully integrated into SmartSoft" Mu-Metal Test Chamber • Optional mu-metal chamber is for magnetic shielding enhancement Sample Heating Stage with a dedicated sample holder "• Replaces the standard ambient temperture stage with the stage which can control the temperture (Temperature range Room temperture to 800°C). • Zalar Rotation and sample rotation are accomplished, in the same manner as the ambient temperature stage, with +/- 170º stage motion. The range of angles for sample tilting is the same as an ambient temperature stage • One Sample Heating sample holder is included. • Heater and thermocouple integrated in the sample holder for enhanced reliability and temperature control" Sample Transfer Vessel • Allows to transfer samples under vacuum or inert gas environment from another instrument or glove box.